dc.contributor.author | Gao, Weimin | |
dc.contributor.author | Ciofi, Ivan | |
dc.contributor.author | Saad, Yves | |
dc.contributor.author | Matagne, Philippe | |
dc.contributor.author | Bachman, Michael | |
dc.contributor.author | Oulmane, Mohamed | |
dc.contributor.author | Gillijns, Werner | |
dc.contributor.author | Lucas, Kevin | |
dc.contributor.author | Demmerle, Wolfgang | |
dc.contributor.author | Schmoeller, Thomas | |
dc.date.accessioned | 2021-10-22T19:18:16Z | |
dc.date.available | 2021-10-22T19:18:16Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25285 | |
dc.source | IIOimport | |
dc.title | Patterning process exploration of metal 1 layer in 7nm node with 3D pattering flow simulations | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Ciofi, Ivan | |
dc.contributor.imecauthor | Matagne, Philippe | |
dc.contributor.imecauthor | Gillijns, Werner | |
dc.contributor.orcidimec | Ciofi, Ivan::0000-0003-1374-4116 | |
dc.contributor.orcidimec | Gillijns, Werner::0000-0002-2430-7360 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 942609 | |
dc.source.conference | Optical Microlithographies XXVIII | |
dc.source.conferencedate | 22/02/2015 | |
dc.source.conferencelocation | San Jose, CA USA | |
dc.identifier.url | http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=2210053 | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings o f SPIE; Vol. 9426 | |