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Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow

dc.contributor.authorHussin, Razaidi
dc.contributor.authorGerrer, Louis
dc.contributor.authorDing, Jie
dc.contributor.authorWang, Liping
dc.contributor.authorAmoroso, Salvatore
dc.contributor.authorCheng, Binjie
dc.contributor.authorWeckx, Pieter
dc.contributor.authorSimicic, Marko
dc.contributor.authorFranco, Jacopo
dc.contributor.authorVanderheyden, Annelies
dc.contributor.authorVanhaeren, Danielle
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorKaczer, Ben
dc.contributor.authorAsenov, Asen
dc.date.accessioned2021-10-22T19:48:16Z
dc.date.available2021-10-22T19:48:16Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25406
dc.sourceIIOimport
dc.titleStatistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorVanhaeren, Danielle
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecVanhaeren, Danielle::0000-0001-8624-9533
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpage238
dc.source.endpage241
dc.source.conference45th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate14/09/2015
dc.source.conferencelocationGraz Austria
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7324758
imec.availabilityPublished - imec


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