dc.contributor.author | Hussin, Razzaidi | |
dc.contributor.author | Gerrer, Louis | |
dc.contributor.author | Ding, Jie | |
dc.contributor.author | Amaroso, Salvatore | |
dc.contributor.author | Wang, Liping | |
dc.contributor.author | Simicic, Marko | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Vanderheyden, Annelies | |
dc.contributor.author | Vanhaeren, Danielle | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Asenov, Asen | |
dc.date.accessioned | 2021-10-22T19:48:34Z | |
dc.date.available | 2021-10-22T19:48:34Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25407 | |
dc.source | IIOimport | |
dc.title | Reliability aware simulation flow: from TCAD calibration to circuit level analysis | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simicic, Marko | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Vanhaeren, Danielle | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Simicic, Marko::0000-0002-3623-1842 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Vanhaeren, Danielle::0000-0001-8624-9533 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 152 | |
dc.source.endpage | 155 | |
dc.source.conference | International Conference on Simulation of Semiconductor Processes and Devices - SISPAD | |
dc.source.conferencedate | 9/09/2015 | |
dc.source.conferencelocation | Washington, DC USA | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7292281 | |
imec.availability | Published - open access | |