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A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias

dc.contributor.authorJi, Z.
dc.contributor.authorZhang, J.F.
dc.contributor.authorLin, L.
dc.contributor.authorDuan, M.
dc.contributor.authorZhang, W.
dc.contributor.authorZhang, X.
dc.contributor.authorGao, R.
dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorSchram, Tom
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T19:55:11Z
dc.date.available2021-10-22T19:55:11Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25430
dc.sourceIIOimport
dc.titleA test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageT36
dc.source.endpageT37
dc.source.conferenceVLSI Technology Symposium
dc.source.conferencedate15/06/2015
dc.source.conferencelocationKyoto Japan
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7223693
imec.availabilityPublished - open access


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