Investigating the electronic properties of Al2O3/Cu(In,Ga)Se2 interface

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Authors

Kotipalli, R.; Vermang, Bart; Joel, J.; Rajkumar, R.; Edoff, M.; Flandre, D.

ISSN

2158-3226

Issue

10

Journal

AIP Advances

Volume

5

Title

Investigating the electronic properties of Al2O3/Cu(In,Ga)Se2 interface

Publication type

Journal article

Embargo date

9999-12-31

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