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Investigating the electronic properties of Al2O3/Cu(In,Ga)Se2 interface

dc.contributor.authorKotipalli, R.
dc.contributor.authorVermang, Bart
dc.contributor.authorJoel, J.
dc.contributor.authorRajkumar, R.
dc.contributor.authorEdoff, M.
dc.contributor.authorFlandre, D.
dc.date.accessioned2021-10-22T20:13:24Z
dc.date.available2021-10-22T20:13:24Z
dc.date.issued2015
dc.identifier.issn2158-3226
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25489
dc.sourceIIOimport
dc.titleInvestigating the electronic properties of Al2O3/Cu(In,Ga)Se2 interface
dc.typeJournal article
dc.contributor.imecauthorVermang, Bart
dc.contributor.orcidimecVermang, Bart::0000-0003-2669-2087
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage107101
dc.source.journalAIP Advances
dc.source.issue10
dc.source.volume5
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/adva/5/10/10.1063/1.4932512
imec.availabilityPublished - open access


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