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Conference contributions
ESD reliability of FinFETs and 3D ICs
Publication:
ESD reliability of FinFETs and 3D ICs
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Date
2015-07
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Linten, Dimitri
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1776
since deposited on 2021-10-22
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last month
Acq. date: 2025-12-16
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Metrics
Views
1776
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-16
Citations