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ESD reliability of FinFETs and 3D ICs

dc.contributor.authorLinten, Dimitri
dc.date.accessioned2021-10-22T20:37:34Z
dc.date.available2021-10-22T20:37:34Z
dc.date.issued2015-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25565
dc.sourceIIOimport
dc.titleESD reliability of FinFETs and 3D ICs
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage3
dc.source.conferenceEOSESD Symposium Asia
dc.source.conferencedate1/07/2015
dc.source.conferencelocationSeoul South Korea
imec.availabilityPublished - imec


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