Defect characterization after ESD stress: merging TLP and Pulsed-IV techniques

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Authors
Linten, Dimitri; Ji, Zhigang; Boschke, Roman; Hellings, Geert; Chen, Shih-Hung; Scholz, Mirko; Alian, AliReza; Collaert, Nadine; Thean, Aaron
Conference
9th International Electrostatic Discharge Workshop - IEW
Title
Defect characterization after ESD stress: merging TLP and Pulsed-IV techniques
Publication type
Meeting abstract
Embargo date
9999-12-31
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