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Defect characterization after ESD stress: merging TLP and Pulsed-IV techniques

dc.contributor.authorLinten, Dimitri
dc.contributor.authorJi, Zhigang
dc.contributor.authorBoschke, Roman
dc.contributor.authorHellings, Geert
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorScholz, Mirko
dc.contributor.authorAlian, AliReza
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T20:37:54Z
dc.date.available2021-10-22T20:37:54Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25566
dc.sourceIIOimport
dc.titleDefect characterization after ESD stress: merging TLP and Pulsed-IV techniques
dc.typeMeeting abstract
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conference9th International Electrostatic Discharge Workshop - IEW
dc.source.conferencedate4/05/2015
dc.source.conferencelocationLake Tahoe, CA USA
imec.availabilityPublished - open access


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