Effect of VUV photons on low-k OSG damage and etching by F atoms at the lowered temperature
dc.contributor.author | Lopaev, D | |
dc.contributor.author | Rakhimova, T | |
dc.contributor.author | Mankelevich, Y | |
dc.contributor.author | Kurchikov, K. | |
dc.contributor.author | Zyryanov, S. | |
dc.contributor.author | Zotovich, A. | |
dc.contributor.author | Baklanov, Mikhaïl | |
dc.date.accessioned | 2021-10-22T20:40:57Z | |
dc.date.available | 2021-10-22T20:40:57Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25575 | |
dc.source | IIOimport | |
dc.title | Effect of VUV photons on low-k OSG damage and etching by F atoms at the lowered temperature | |
dc.type | Meeting abstract | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | n/a | |
dc.source.conference | Plasma Etch and Strip in Microtechnology - PESM | |
dc.source.conferencedate | 27/04/2015 | |
dc.source.conferencelocation | Leuven Belgium | |
dc.identifier.url | http://pesm-conference.org/files/2015_abstractbook.pdf | |
imec.availability | Published - open access |