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First-principles study of the performance degradation of 2D channel-based transistors with sub-10 nm gate lengths
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First-principles study of the performance degradation of 2D channel-based transistors with sub-10 nm gate lengths
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lu, Augustin
;
Pourtois, Geoffrey
;
Stokbro, Kurt
;
Thean, Aaron
;
Radu, Iuliana
;
Houssa, Michel
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Abstract
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1896
since deposited on 2021-10-22
Acq. date: 2026-01-09
Citations
Metrics
Views
1896
since deposited on 2021-10-22
Acq. date: 2026-01-09
Citations