A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS

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Authors
Parvais, Bertrand; Wambacq, Piet; Mercha, Abdelkarim; Verkest, Diederik; Thean, Aaron; Hammo, Hiroaki; Oishi, Tetsuya; Sawada, Ken; Nomoto, Kazuki
Conference
IEEE Asian Solid-State Circuit Conference - A-SSCC
Title
A digital intensive circuit for low-frequency noise monitoring in 28nm CMOS
Publication type
Proceedings paper
Embargo date
9999-12-31
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