Publication:
In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1838 since deposited on 2021-10-22
397item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1838 since deposited on 2021-10-22
397item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations