Show simple item record

Detailed analysis of transport properties of FinFETs through Y-function method: effects of substrate orientation and strain

dc.contributor.authorRibeiro, Thales
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMartino, Joao
dc.contributor.authorPavanello, Marcelo
dc.date.accessioned2021-10-22T22:14:37Z
dc.date.available2021-10-22T22:14:37Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25818
dc.sourceIIOimport
dc.titleDetailed analysis of transport properties of FinFETs through Y-function method: effects of substrate orientation and strain
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conference30th Symposium on Microelectronics Technology and Devices - SBMICRO
dc.source.conferencedate31/08/2015
dc.source.conferencelocationSalvador de Bahia Brazil
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7298145
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
31818.pdf
Size:
1.363Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record