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Characterization and modeling of reliability issues in nanoscale devices
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Authors
Rzepa, Gerhard
;
Goes, Wolfgang
;
Kaczer, Ben
;
Grasser, Tibor
Conference
IEEE International Symposium on Circuits and Systems - ISCAS
Title
Characterization and modeling of reliability issues in nanoscale devices
Publication type
Proceedings paper
Embargo date
9999-12-31
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