Show simple item record

Characterization and modeling of reliability issues in nanoscale devices

dc.contributor.authorRzepa, Gerhard
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.date.accessioned2021-10-22T22:27:17Z
dc.date.available2021-10-22T22:27:17Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25848
dc.sourceIIOimport
dc.titleCharacterization and modeling of reliability issues in nanoscale devices
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2445
dc.source.endpage2448
dc.source.conferenceIEEE International Symposium on Circuits and Systems - ISCAS
dc.source.conferencedate24/05/2015
dc.source.conferencelocationLisboa Portugal
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7169179
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
33149.pdf
Size:
1.884Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record