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Lithographic performance of 193 nm resist
Publication:
Lithographic performance of 193 nm resist
Date
1998
Proceedings Paper
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2675.pdf
1.71 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Goethals, Mieke
;
Pollers, Ingrid
;
Van Roey, Frieda
;
Sugihara, Takashi
;
Ronse, Kurt
;
Heskamp, B.
;
Davies, G.
;
Gehoel-van Ansem, W.
;
Paniez, P.
;
Temerson, T. M.
;
Hien, S.
;
Mortini, B.
;
Romeo, C.
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1960
since deposited on 2021-09-30
414
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1960
since deposited on 2021-09-30
414
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations