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MOSFET variability and reliability characterization array
Publication:
MOSFET variability and reliability characterization array
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Date
2015
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simicic, Marko
;
Putcha, Vamsi
;
Parvais, Bertrand
;
Weckx, Pieter
;
Kaczer, Ben
;
Groeseneken, Guido
;
Gielen, Georges
;
Linten, Dimitri
;
Thean, Aaron
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1867
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Acq. date: 2025-12-18
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Metrics
Views
1867
since deposited on 2021-10-22
2
last month
Acq. date: 2025-12-18
Citations