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MOSFET variability and reliability characterization array

dc.contributor.authorSimicic, Marko
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorParvais, Bertrand
dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorGielen, Georges
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T22:52:21Z
dc.date.available2021-10-22T22:52:21Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25906
dc.sourceIIOimport
dc.titleMOSFET variability and reliability characterization array
dc.typeMeeting abstract
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.conferenceIEEE International Integrated Reliability Workshop - IIRW
dc.source.conferencedate11/10/2015
dc.source.conferencelocationSouth Lake tahoe, CA USA
dc.identifier.urlhttp://www.iirw.org/fileadmin/user_upload/2015_9_18_IIRW_2015_TPC_Schedule.pdf
imec.availabilityPublished - imec


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