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Experimental validation of electromigration by low frequency noise measurement for advanced interconnects application
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Authors
Tang, Baojun
;
Croes, Kristof
;
Simoen, Eddy
;
Beyne, Sofie
;
Adelmann, Christoph
;
Tokei, Zsolt
Conference
23rd International Conference on Noise and 1/f Fluctuations - ICNF
Title
Experimental validation of electromigration by low frequency noise measurement for advanced interconnects application
Publication type
Proceedings paper
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