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On MOS admittance modeling to study border trap capture/emission and its effect on electrical behavior of high-k/III-V MOS devices
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Authors
Vais, Abhitosh
;
Martens, Koen
;
Lin, Dennis
;
Collaert, Nadine
;
Mocuta, Anda
;
De Meyer, Kristin
;
Thean, Aaron
ISSN
0167-9317
Journal
Microelectronic Engineering
Volume
147
Title
On MOS admittance modeling to study border trap capture/emission and its effect on electrical behavior of high-k/III-V MOS devices
Publication type
Journal article
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