A 60 dB SNDR 35 MS/s SAR ADC with comparator-noise-based stochastic residue estimation

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Authors

Verbruggen, Bob; Tsouhlarakis, Jorgo; Yamamoto, Takaya; Iriguchi, Masao; Martens, Ewout; Craninckx, Jan

ISSN

0018-9200

Issue

9

Journal

IEEE Journal of Solid-State Circuits

Volume

50

Title

A 60 dB SNDR 35 MS/s SAR ADC with comparator-noise-based stochastic residue estimation

Publication type

Journal article

Embargo date

9999-12-31

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