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Radiation effects on metal contaminated Si diodes

dc.contributor.authorHakata, T.
dc.contributor.authorOhyama, Hidenori
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, C.
dc.contributor.authorSunage, H.
dc.contributor.authorMiyahara, K.
dc.date.accessioned2021-09-30T12:07:23Z
dc.date.available2021-09-30T12:07:23Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2616
dc.sourceIIOimport
dc.titleRadiation effects on metal contaminated Si diodes
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conference4th International Conference on Electronic Materials - ICEM 98; 24-27 August 1998; Cheju, Korea.
dc.source.conferencelocation
imec.availabilityPublished - imec


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