dc.contributor.author | Wu, Tian-Li | |
dc.contributor.author | Marcon, Denis | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Van Hove, Marleen | |
dc.contributor.author | Bakeroot, Benoit | |
dc.contributor.author | Stoffels, Steve | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Decoutere, Stefaan | |
dc.contributor.author | Roelofs, Robin | |
dc.date.accessioned | 2021-10-23T01:09:44Z | |
dc.date.available | 2021-10-23T01:09:44Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26193 | |
dc.source | IIOimport | |
dc.title | Time dependent dielectric breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics of AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Marcon, Denis | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Bakeroot, Benoit | |
dc.contributor.imecauthor | Stoffels, Steve | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Bakeroot, Benoit::0000-0003-4392-1777 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 6C.4 | |
dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 19/04/2015 | |
dc.source.conferencelocation | Monterey, CA USA | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112769 | |
imec.availability | Published - open access | |