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Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices
Publication:
Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devices
Date
1998
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hantschel, Thomas
;
Trenkler, Thomas
;
Vandervorst, Wilfried
;
Malave, A.
;
Kulisch, W.
;
Oesterschulze, E.
;
Buechel, D.
Journal
Abstract
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1947
since deposited on 2021-09-30
436
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1947
since deposited on 2021-09-30
436
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations