Authors

Yoshida, S.; Taniguchi, S.; Minari, Hideki; Lin, Dennis; Ivanov, Tsvetan; Watanabe, H.; Nakazawa, Masashi; Collaert, Nadine; Thean, Aaron

Conference

Extended Abstracts of International Workshop on Dielectric Thin Films for Future Electron Devices - IWDTF

Title

The impact of energy barrier height on border traps in III-V gate stacks

Publication type

Proceedings paper