Authors

Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim

Conference

IEEE Computer Society Annual Symposium on VLSI - ISVLSI

Title

Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability

Publication type

Proceedings paper

Embargo date

9999-12-31