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Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability

dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.contributor.authorDehaene, Wim
dc.date.accessioned2021-10-23T10:04:21Z
dc.date.available2021-10-23T10:04:21Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26275
dc.sourceIIOimport
dc.titleQuantification of sense amplifier offset voltage degradation due to zero-and run-time variability
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage725
dc.source.endpage730
dc.source.conferenceIEEE Computer Society Annual Symposium on VLSI - ISVLSI
dc.source.conferencedate11/06/2016
dc.source.conferencelocationPittsburgh, PA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7560287/
imec.availabilityPublished - open access


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