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Conference contributions
In-line resistance measurement of single nanometer-wide trenches and fins
Publication:
In-line resistance measurement of single nanometer-wide trenches and fins
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bogdanowicz, Janusz
;
Parmentier, Brigitte
;
Schulze, Andreas
;
Moussa, Alain
;
Merckling, Clement
;
Kunert, Bernardette
;
Guo, Weiming
;
Porret, Clément
;
Rosseel, Erik
;
Hikavyy, Andriy
;
Hansen, Ole
;
Petersen, D.H
;
Henrichsen, H.H.
;
Nielsen, P.F
;
Vandervorst, Wilfried
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1878
since deposited on 2021-10-23
Acq. date: 2025-10-29
Citations
Metrics
Views
1878
since deposited on 2021-10-23
Acq. date: 2025-10-29
Citations