dc.contributor.author | Celano, Umberto | |
dc.contributor.author | Capogreco, Elena | |
dc.contributor.author | Lisoni, Judit | |
dc.contributor.author | Arreghini, Antonio | |
dc.contributor.author | Kunert, Bernardette | |
dc.contributor.author | Guo, Weiming | |
dc.contributor.author | Van den Bosch, Geert | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Furnemont, Arnaud | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-23T10:12:56Z | |
dc.date.available | 2021-10-23T10:12:56Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26404 | |
dc.source | IIOimport | |
dc.title | Direct three-dimensional observation of the conduction in poly-Si and In1-xGaxAs 3D NAND vertical channels | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Celano, Umberto | |
dc.contributor.imecauthor | Capogreco, Elena | |
dc.contributor.imecauthor | Arreghini, Antonio | |
dc.contributor.imecauthor | Kunert, Bernardette | |
dc.contributor.imecauthor | Van den Bosch, Geert | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Furnemont, Arnaud | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
dc.contributor.orcidimec | Arreghini, Antonio::0000-0002-7493-9681 | |
dc.contributor.orcidimec | Kunert, Bernardette::0000-0002-8986-4109 | |
dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.contributor.orcidimec | Furnemont, Arnaud::0000-0002-6378-1030 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 192 | |
dc.source.endpage | 193 | |
dc.source.conference | IEEE Symposium on VLSI Technology | |
dc.source.conferencedate | 14/06/2016 | |
dc.source.conferencelocation | Honolulu, HI USA | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7573430 | |
imec.availability | Published - open access | |