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Tomographic filament observation and scaling projection of RRAM in 3 x 3 nm dimensions

dc.contributor.authorCelano, Umberto
dc.contributor.authorHou, Yi
dc.contributor.authorGoux, Ludovic
dc.contributor.authorFantini, Andrea
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-23T10:13:16Z
dc.date.available2021-10-23T10:13:16Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26407
dc.sourceIIOimport
dc.titleTomographic filament observation and scaling projection of RRAM in 3 x 3 nm dimensions
dc.typeMeeting abstract
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.source.peerreviewno
dc.source.beginpageEP11.5.01
dc.source.conferenceMRS Spring Meeting Symposium EP11: Novel Materials for End-of-Roadmap Devices in Logic, Power and Memory
dc.source.conferencedate28/03/2016
dc.source.conferencelocationPhoenix, AZ USA
imec.availabilityPublished - imec


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