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Statistical investigation of the impact of program history and oxide-metal interface on OxRRAM retention
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Authors
Chen, Michael
;
Fantini, Andrea
;
Degraeve, Robin
;
Redolfi, Augusto
;
Groeseneken, Guido
;
Goux, Ludovic
;
Kar, Gouri Sankar
Conference
IEEE International Electron Devices Meeting - IEEE IEDM
Title
Statistical investigation of the impact of program history and oxide-metal interface on OxRRAM retention
Publication type
Proceedings paper
Embargo date
9999-12-31
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