Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Presentations
Effect of Si surface roughness on the current-voltage characteristics of ultra-thin gate oxides
Publication:
Effect of Si surface roughness on the current-voltage characteristics of ultra-thin gate oxides
Copy permalink
Date
1998
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Nigam, Tanya
;
Mertens, Paul
;
Heyns, Marc
Journal
Abstract
Description
Statistics
Views
1923
since deposited on 2021-09-30
1
last month
Acq. date: 2026-02-26
Citations
Statistics
Views
1923
since deposited on 2021-09-30
1
last month
Acq. date: 2026-02-26
Citations