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Atomic disorder as an intrinsic source of variability in filamentary RRAM devices – ab initio investigations

dc.contributor.authorClima, Sergiu
dc.contributor.authorFantini, Andrea
dc.contributor.authorGoux, Ludovic
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorJurczak, Gosia
dc.contributor.authorPourtois, Geoffrey
dc.date.accessioned2021-10-23T10:20:52Z
dc.date.available2021-10-23T10:20:52Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26465
dc.sourceIIOimport
dc.titleAtomic disorder as an intrinsic source of variability in filamentary RRAM devices – ab initio investigations
dc.typeMeeting abstract
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecFantini, Andrea::0000-0002-3220-8856
dc.contributor.orcidimecGovoreanu, Bogdan::0000-0001-7210-2979
dc.source.peerreviewno
dc.source.conferenceAVS 63rd International Symposium & Exhibition
dc.source.conferencedate6/11/2016
dc.source.conferencelocationNashville, TN USA
imec.availabilityPublished - imec


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