dc.contributor.author | Cristofani, Edison | |
dc.contributor.author | Becquaert, Mathias | |
dc.contributor.author | Pandey, Gokarna | |
dc.contributor.author | Vandewal, Marijke | |
dc.contributor.author | Deligiannis, Nikos | |
dc.contributor.author | Stiens, Johan | |
dc.date.accessioned | 2021-10-23T10:23:41Z | |
dc.date.available | 2021-10-23T10:23:41Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26484 | |
dc.source | IIOimport | |
dc.title | Compressed sensing and defect-based dictionaries for characteristics extraction in MM-wave non-destructive testing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Stiens, Johan | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 2 | |
dc.source.conference | 41st International Conference on Infrared, Millimeter, and Terahertz waves - IRMMW-THz | |
dc.source.conferencedate | 25/09/2016 | |
dc.source.conferencelocation | Kopenhagen Denmark | |
dc.identifier.url | http://ieeexplore.ieee.org/document/7758678/ | |
imec.availability | Published - open access | |