Publication:

Compressed sensing and defect-based dictionaries for characteristics extraction in MM-wave non-destructive testing

Date

2016

Proceedings Paper

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Files

34575.pdf 222.12 KB

Author(s)

Cristofani, Edison

;

Becquaert, Mathias

;

Pandey, Gokarna

;

Vandewal, Marijke

;

Deligiannis, Nikos

;

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Acq. date: 2026-09-10