Authors

Cristofani, Edison; Becquaert, Mathias; Pandey, Gokarna; Vandewal, Marijke; Deligiannis, Nikos; Stiens, Johan

Conference

41st International Conference on Infrared, Millimeter, and Terahertz waves - IRMMW-THz

Title

Compressed sensing and defect-based dictionaries for characteristics extraction in MM-wave non-destructive testing

Publication type

Proceedings paper

Embargo date

9999-12-31