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Compressed sensing and defect-based dictionaries for characteristics extraction in MM-wave non-destructive testing
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Compressed sensing and defect-based dictionaries for characteristics extraction in MM-wave non-destructive testing
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Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cristofani, Edison
;
Becquaert, Mathias
;
Pandey, Gokarna
;
Vandewal, Marijke
;
Deligiannis, Nikos
;
Stiens, Johan
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Acq. date: 2025-12-12
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1907
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-12
Citations