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Compressed sensing and defect-based dictionaries for characteristics extraction in MM-wave non-destructive testing

Date

2016
Proceedings Paper
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dc.contributor.authorCristofani, Edison
dc.contributor.authorBecquaert, Mathias
dc.contributor.authorPandey, Gokarna
dc.contributor.authorVandewal, Marijke
dc.contributor.authorDeligiannis, Nikos
dc.contributor.authorStiens, Johan
dc.contributor.imecauthorStiens, Johan
dc.date.accessioned2021-10-23T10:23:41Z
dc.date.available2021-10-23T10:23:41Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26484
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7758678/
dc.source.beginpage1
dc.source.conference41st International Conference on Infrared, Millimeter, and Terahertz waves - IRMMW-THz
dc.source.conferencedate25/09/2016
dc.source.conferencelocationKopenhagen Denmark
dc.source.endpage2
dc.title

Compressed sensing and defect-based dictionaries for characteristics extraction in MM-wave non-destructive testing

dc.typeProceedings paper
dspace.entity.typePublication
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