Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

Duan, Guo Xing; Hachtel, Jordan; Zhang, En Xia; Zhang, Cher Xuan; Fleetwood, Daniel; Schrimpf, Ronald; Reed, Robert; Mitard, Jerome; Linten, Dimitri; Witters, Liesbeth; Collaert, Nadine; Mocuta, Anda; Chisholm, Matthew; Pantelides, Sokrates

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Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

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2016

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IEEE Transactions on Device and Materials Reliability

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Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

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