Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

View/open

35390.pdf (1.198Mb)

Metadata

Show full item record

Authors

Duan, Guo Xing; Hachtel, Jordan; Zhang, En Xia; Zhang, Cher Xuan; Fleetwood, Daniel; Schrimpf, Ronald; Reed, Robert; Mitard, Jerome; Linten, Dimitri; Witters, Liesbeth; Collaert, Nadine; Mocuta, Anda; Chisholm, Matthew; Pantelides, Sokrates

ISSN

1530-4388

Issue

4

Journal

IEEE Transactions on Device and Materials Reliability

Volume

16

Title

Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

Publication type

Journal article

Embargo date

9999-12-31

Collections

Articles