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dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorAlian, AliReza
dc.contributor.authorBordallo, Caio
dc.contributor.authorSmets, Quentin
dc.contributor.authorDesplanque, Ludovic
dc.contributor.authorWallart, Xavier
dc.contributor.authorRichard, Olivier
dc.contributor.authorDouhard, Bastien
dc.contributor.authorVerhulst, Anne
dc.contributor.authorCollaert, Nadine
dc.contributor.authorMerckling, Clement
dc.contributor.authorHeyns, Marc
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-23T10:44:03Z
dc.date.available2021-10-23T10:44:03Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26594
dc.sourceIIOimport
dc.titleInfluence of doping and tunneling interface stoichiometry on n+In0.5Ga0.5As/p+GaAs0.5Sb0.5 Esaki diode behavior
dc.typeProceedings paper
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorDouhard, Bastien
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage73
dc.source.endpage80
dc.source.conferenceInternational Symposium on Functional Diversification of Semiconductor Electronics 3 (More-Than-Moore 3)
dc.source.conferencedate29/05/2016
dc.source.conferencelocationSan Diego, CA USA
dc.identifier.urlhttp://ecst.ecsdl.org/content/72/3/73.abstract
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 72, Issue 3


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