Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Impact of the effective work function gate metal on the low-frequency noise of gate-all-around Silicon-on-Insulator NWFETs
Publication:
Impact of the effective work function gate metal on the low-frequency noise of gate-all-around Silicon-on-Insulator NWFETs
Date
2016
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
33041.pdf
440.01 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fang, Wen
;
Veloso, Anabela
;
Simoen, Eddy
;
Cho, Moon Ju
;
Collaert, Nadine
;
Thean, Aaron
;
Luo, Jun
;
Zhao, Chao
;
Ye, T.
;
Claeys, Cor
Journal
IEEE Electron Device Letters
Abstract
Description
Metrics
Views
1871
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1871
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations