Publication:
Statistical model of the NBTI-induced threshold voltage, subthreshold swing, and transconductance degradations in advanced p-FinFETs
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1816 since deposited on 2021-10-23
2last month
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Acq. date: 2026-01-07
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1816 since deposited on 2021-10-23
2last month
1last week
Acq. date: 2026-01-07
Citations