Show simple item record

Statistical model of the NBTI-induced threshold voltage, subthreshold swing, and transconductance degradations in advanced p-FinFETs

dc.contributor.authorFranco, Jacopo
dc.contributor.authorKaczer, Ben
dc.contributor.authorMukhopadhyay, Subhadeep
dc.contributor.authorDuhan, Pardeep
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRoussel, Philippe
dc.contributor.authorChiarella, Thomas
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorTrojman, Lionel
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorSpessot, Alessio
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMocuta, Anda
dc.date.accessioned2021-10-23T10:52:00Z
dc.date.available2021-10-23T10:52:00Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26629
dc.sourceIIOimport
dc.titleStatistical model of the NBTI-induced threshold voltage, subthreshold swing, and transconductance degradations in advanced p-FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage388
dc.source.endpage401
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate3/12/2016
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
34270.pdf
Size:
649.4Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record