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Impact of the transmission line properties of a metal-ultrathin silicon dioxide-semiconductor field-effect transistor on the extracted inversion-layer thickness
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1923 since deposited on 2021-09-30
1last month
Acq. date: 2026-01-09
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1923 since deposited on 2021-09-30
1last month
Acq. date: 2026-01-09
Citations