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Photo-elastic characterization of defect structures in mono and multi-crystalline semiconductor materials

dc.contributor.authorHerms, Martin
dc.contributor.authorWagner, Matthias
dc.contributor.authorKayser, Stefan
dc.contributor.authorKießling, Frank
dc.contributor.authorPoklad, Anna
dc.contributor.authorZhao, Ming
dc.contributor.authorKretzer, Ulrich
dc.date.accessioned2021-10-23T11:14:32Z
dc.date.available2021-10-23T11:14:32Z
dc.date.issued2016-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26719
dc.sourceIIOimport
dc.titlePhoto-elastic characterization of defect structures in mono and multi-crystalline semiconductor materials
dc.typeMeeting abstract
dc.contributor.imecauthorZhao, Ming
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.source.peerreviewyes
dc.source.beginpage77
dc.source.conferenceExtended Defects in Semiconductors (EDS) Conference
dc.source.conferencedate25/09/2016
dc.source.conferencelocationLes Issambres France
imec.availabilityPublished - imec


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