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Statistical analysis of the impact of anode recess on the electrical characteristics of AlGaN/GaN Schottky diodes with gated edge termination
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Authors
Hu, Jie
;
Stoffels, Steve
;
Lenci, Silvia
;
De Jaeger, Brice
;
Ronchi, Nicolo
;
Tallarico, Andrea
;
Wellekens, Dirk
;
You, Shuzhen
;
Bakeroot, Benoit
;
Groeseneken, Guido
;
Decoutere, Stefaan
ISSN
0018-9383
Issue
9
Journal
IEEE Transactions on Electron Devices
Volume
63
Title
Statistical analysis of the impact of anode recess on the electrical characteristics of AlGaN/GaN Schottky diodes with gated edge termination
Publication type
Journal article
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