Device breakdown optimization of Al2O3/GaN E-mode MISFETs

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Authors
Kang, Xuanwu; Wellekens, Dirk; Van Hove, Marleen; De Jaeger, Brice; Ronchi, Nicolo; Wu, Tian-Li; You, Shuzhen; Bakeroot, Benoit; Hu, Jie; Marcon, Denis; Stoffels, Steve; Decoutere, Stefaan
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Device breakdown optimization of Al2O3/GaN E-mode MISFETs
Publication type
Proceedings paper
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