dc.contributor.author | Kiamehr, Saman | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Tahoori, Mehdi | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Kukner, Halil | |
dc.contributor.author | Raghavan, Praveen | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Catthoor, Francky | |
dc.date.accessioned | 2021-10-23T11:46:49Z | |
dc.date.available | 2021-10-23T11:46:49Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26828 | |
dc.source | IIOimport | |
dc.title | The impact of process variation and stochastic aging in nanoscale VLSI | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Catthoor, Francky | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | CR-1 | |
dc.source.conference | International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 2/04/2016 | |
dc.source.conferencelocation | Pasadena, CA USA | |
dc.identifier.url | http://ieeexplore.ieee.org/document/7574590/ | |
imec.availability | Published - open access | |