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Physical design solutions to tackle FEOL/BEOL degradation in gate-level monolithic 3D ICs
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Physical design solutions to tackle FEOL/BEOL degradation in gate-level monolithic 3D ICs
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Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ku, Bon Woong
;
Debacker, Peter
;
Milojevic, Dragomir
;
Raghavan, Praveen
;
Verkest, Diederik
;
Thean, Aaron
;
Lim, Sung Kyu
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1918
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Acq. date: 2026-01-07
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Views
1918
since deposited on 2021-10-23
1
last month
1
last week
Acq. date: 2026-01-07
Citations